International Workshop on PATSTAT and Patent Statistics 2010.1.19
■ International Workshop on PATSTAT and Patent StatisticsJanuary 19, 2010 at 7F Conference Room, Institute of Intellectual Property, Kanda, TokyoOrganized by Institute of Intellectual PropertySupported by IIR Opening AddressTateo Takiuchi (Institute of Intellectual Property)Dominique Guellec (OECD Senior Economist)[1] “Guide to the PATSTAT” James Rollinson (European Patent Office)[2] “Linking of PATSTAT and IIP Patent Database” Kazuyuki Motohashi (University of Tokyo)[3] “Evaluating Continuing Applications in the US, Using PATSTAT Database” Naotoshi Tsukada (IIR)[4] “An Econometric Assessment of the Effects of Patent Thickets“ Yoichiro Nishimura (Kanagawa University) and Sadao Nagaoka (IIR) Closing RemarksSadao Nagaoka